Apparatuses and methods to mask write operations for a mode of operation using ecc circuitry

ABSTRACT

An exemplary semiconductor device includes an input/output (I/O) circuit configured to combine data corresponding to a write command received via data terminals with a first subset of corrected read data retrieved from a memory cell array to provide write data. The exemplary semiconductor device further includes a write driver circuit configured to mask a write operation of a first bit of the write data that corresponds to a bit of the first subset of the read data and to perform a write operation for a second bit of the write data that corresponds to the data received via the data terminals.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation of U.S. patent application Ser. No.16/559,497, filed Sep. 3, 2019. This application is incorporated byreference herein in its entirety and for all purposes.

BACKGROUND OF THE INVENTION

High data reliability, high speed of memory access, low power, andreduced chip size are features that are demanded from semiconductormemory. In some applications, semiconductor memory devices may bedesigned to operate in more than one mode to accommodate differentapplications, such as different data bus widths. However, introducingconfigurability may increase complexity in design, power consumption, orlatency. For example, execution of a write operation within asemiconductor memory device for a first bus width may be different thanexecution of a write operation for a second bus width within thesemiconductor memory device. It may be preferable to mitigate some ofthe effects of the increased complexity resulting from implementingconfigurability options.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram of a semiconductor device in accordance withan embodiment of the disclosure.

FIG. 2 is a schematic block diagram of a portion of a semiconductordevice, in accordance with an embodiment of the present disclosure.

FIG. 3 is a schematic block diagram of a main input/output write drivercircuit, in accordance with an embodiment of the present disclosure.

FIG. 4 is a schematic block diagram of a portion of a main input/outputwrite driver configured to control voltages on complementary main IOsignal lines, in accordance with an embodiment of the presentdisclosure.

FIG. 5 provides an exemplary flow diagram of a second mode initial readoperation, in accordance with embodiments of the present disclosure.

FIG. 6 is an exemplary flow diagram of the second mode write operationfor driving signals to a main input/output write driver circuit, inaccordance with embodiments of the present disclosure.

FIG. 7A provides exemplary ECC bit data circuitry, in accordance withembodiments of the present disclosure.

FIG. 7B provides exemplary ECC control plane data circuitry, inaccordance with embodiments of the present disclosure.

FIG. 7C provides exemplary error location circuitry to compare one ERRBbit with ERRCP bits, in accordance with embodiments of the presentdisclosure.

FIG. 8 provides an exemplary control circuit in accordance withembodiments of the present disclosure.

DETAILED DESCRIPTION

Certain details are set forth below to provide a sufficientunderstanding of embodiments of the present disclosure. However, it willbe clear to one skilled in the art that embodiments of the presentdisclosure may be practiced without these particular details. Moreover,the particular embodiments of the present disclosure described hereinare provided by way of example and should not be used to limit the scopeof the disclosure to these particular embodiments. In other instances,well-known circuits, control signals, timing protocols, and softwareoperations have not been shown in detail in order to avoid unnecessarilyobscuring the disclosure.

Some of the material described in this disclosure includes circuitry andtechniques for reducing current draw during write operations in certainmodes of operation by masking some write operations. A semiconductordevice may be capable of operating in system implementations withdifferent data bus widths. For example, the semiconductor device may beconfigured to operate a selected one of multiple input/output (I/O) busconfigurations (e.g., data bus width modes), such as an x4 mode (e.g.,data bus is 4 bits wide), an x8 mode (e.g., data bus is 8 bits wide),etc. During a read or write operation, data bits may be sent or receivedover a fixed burst length (e.g., 8, 16, 32, etc. bit burst lengths).Thus, the number of write bits received when in the x4 mode may bedifferent than the number of write bits received when operating in thex8 mode. For example, if the burst length is 16 bits, then 64 bits wouldbe received in the x4 mode and 128 bits would be received in the x8mode.

To reduce complexity with generation of error detection codes toindicate whether data read from an address of a memory cell arraymatches data that was previously written to the address of the memorycell array, the internal read/write circuitry may be configured togenerate error detection codes based on a fixed number of bits that isindependent of the selected I/O bus configuration. Thus,error-correcting code (ECC) circuitry may generate ECCs for a fixednumber of data bits to be written to memory that are then stored at inthe memory cell array along with the write data. In some examples, whenfewer bits of write data are received via the I/O bus for a writeoperation directed to a particular address than are needed to generatethe ECC, the semiconductor device may first perform a read operation toretrieve read data from the particular address, and combine a firstsubset of read data (e.g., old data) with the write data received viathe I/O bus for the write operation (e.g., new data) to form a set ofwrite data bits to be written to the array. For example, bits in bitpositions K (e.g., wherein X is equal to 127, 63, etc.) to M+1 (e.g.,wherein M is equal to 63, 31, etc.) of the set of write data bits mayinclude the write data received from via the I/O bus and bits in bitpositions M to 0 may include the first subset of read data. As anotherexample, bits in bit positions K to M+1 of the set of write data bitsmay include the first subset of read data and bits in bit positions M to0 may include the write data received from via the I/O bus. The ECCcircuitry may generate an ECC code for the write data bits being writtento the array. In this scenario, the subset of read data may be writtenback to the memory, along with the write data received via the I/O busand the new ECC code.

During both read and write operations, column select (CS) signal linesare enabled and at least one pair of data lines (e.g., main I/O (MIO) orglobal I/O (GIO)) are driven to complementary logical voltagepolarities. Typically, the CS signal lines remain enabled until a readand/or write operation is completed. In addition, the voltagedifferential between the pair of data signal lines is smaller for a readoperation than a write operation. Thus, charging the pair of data signallines during the write operation uses more current than charging thesignal lines during the read operation. In addition, when a write orread operation is complete, the pair of data signal lines are equalizedto prepare for a subsequent read or write operation. Thus, because thevoltage differential is higher for a write operation, currentconsumption to equalize the pair of data signal lines is greater thanequalization current consumption for post-read operation equalization.

Thus, to save power in this scenario, control circuitry may disable orturn off selected CS signal lines for a subset of control planescorresponding to the old data that is being written back to the memorycell array in response to an indication that no error is found by theECC circuits. In addition, write driver circuitry may mask writeoperations for unchanged old data of the write data to avoid driving thepair of data signal lines to write voltage polarities. Lastly, during awrite operation, write operations for individual bits of the new datamay be masked that match corresponding bits of a second subset of theread data that is being overwritten with the new data. By turning off CSsignal lines when no error is found and masking write operations for atleast some of the write data bits, current consumption driving the CSsignal lines and driving the pair of data signal lines and duringequalization may be reduced.

FIG. 1 is a schematic block diagram of a semiconductor device 100, inaccordance with an embodiment of the present disclosure. For example,the semiconductor device 100 may include a chip 135 and a ZQ resistor(RZQ) 155. The chip 135 may include a clock input circuit 105, aninternal clock generator 107, a timing generator 109, an address commandinput circuit 115, an address decoder 120, a command decoder 125, acontrol circuit 126, a plurality of row decoders 130, a memory cellarray 145 including sense amplifiers 150 and transfer gates 195, aplurality of column decoders 140, a plurality of read/write amplifiers165, an input/output (I/O) circuit 170, a 172, the ZQ resistor (RZQ)155, a ZQ calibration circuit 175, and a voltage generator 190. Thesemiconductor device 100 may include a plurality of external terminalsincluding address and command terminals coupled to command/address bus110, clock terminals CK and /CK, data terminals DQ, DQS, and DM, powersupply terminals VDD, VSS, VDDQ, and VSSQ, and a calibration terminalZQ. The chip 135 may be mounted on a substrate 160, for example, amemory module substrate, a mother board or the like.

The memory cell array 145 includes a plurality of banks BANK0-N, eachbank BANK0-N including a plurality of word lines WL, a plurality of bitlines BL, and a plurality of memory cells MC arranged at intersectionsof the plurality of word lines WL and the plurality of bit lines BL. Thenumber of banks BANK0-N may include 2, 4, 8, 16, or any other number ofbanks. The selection of the word line WL for each bank is performed by acorresponding row decoder 130 and the selection of the bit line BL isperformed by a corresponding column decoder 140. The plurality of senseamplifiers 150 are located for their corresponding bit lines BL andcoupled to at least one respective local I/O line further coupled to arespective one of at least two main I/O line pairs, via transfer gatesTG 195, which function as switches.

The address/command input circuit 115 may receive an address signal anda bank address signal from outside at the command/address terminals viathe command/address bus 110 and transmit the address signal and the bankaddress signal to the address decoder 120. The address decoder 120 maydecode the address signal received from the address/command inputcircuit 115 and provide a row address signal XADD to the row decoder130, and a column address signal YADD to the column decoder 140. Theaddress decoder 120 may also receive the bank address signal and providethe bank address signal BADD to the row decoder 130 and the columndecoder 140.

The address/command input circuit 115 may receive a command signal fromoutside, such as, for example, a memory controller 105 at thecommand/address terminals via the command/address bus 110 and providethe command signal to the command decoder 125. The command decoder 125may decode the command signal and provide generate various internalcommand signals. For example, the internal command signals may include arow command signal to select a word line, a column command signal, suchas a read command or a write command, to select a bit line, a modregister setting command MRS that may cause mode register settings to bestored at the control circuit 126, and a ZQ calibration command ZQ_comthat may activate the ZQ calibration circuit 175.

Accordingly, when a read command is issued and a row address and acolumn address are timely supplied with the read command, read data isread from a memory cell in the memory cell array 145 designated by therow address and the column address. The read/write amplifiers 165 mayreceive the read data DQ and provide the read data DQ to the IO circuit170. The IO circuit 170 may provide the read data DQ to outside via thedata terminals DQ, together with a data strobe signal at DQS and/or adata mask signal at DM. Similarly, when the write command is issued anda row address and a column address are timely supplied with the writecommand, and then the input/output circuit 170 may receive write data atthe data terminals DQ, together with a data strobe signal at DQS and/ora data mask signal at DM and provide the write data via the read/writeamplifiers 165 to the memory cell array 145. Thus, the write data may bewritten in the memory cell designated by the row address and the columnaddress.

During both read and write operations, the column decoders 140 may drivecolumn select CS signals and the main IO write driver circuit 167 mayeach drive a respective pair of the main IO lines to complementarylogical voltage polarities based on the row and column addresses. Thevoltage differential between the respective pair of signal lines drivenby the main IO write driver circuit 167 may be smaller for a readoperation than a write operation. Thus, during a write operation,current consumption to drive the respective pair of main I/O lines andto equalize the respective pair of main I/O lines to prepare for asubsequent read or write operation may be greater than drive andequalization current consumption for read operations.

In some examples, the semiconductor device 100 may be configured tooperate the IO circuit 170 in a selected one of multiple data terminalDQ bus configurations (e.g., data bus width modes), such as an x4 mode(e.g., data bus is 4 bits wide), an x8 mode (e.g., data bus is 8 bitswide), etc. During a read or write operation, data bits are sent orreceived via the data terminals DQ over a fixed burst length (e.g., 8,16, 32, etc. bit burst lengths), in some examples. Thus, the number ofwrite bits received when in the x4 mode may be different than the numberof write bits received when operating in the x8 mode. For example, ifthe burst length is 16 bits, then 64 bits would be received in the x4mode and 128 bits would be received in the x8 mode.

To reduce complexity associated with generating error correction anddetection codes generated for data written to the memory cell array 145,the column decoders 140, the row decoders 130, the read/write amplifiers165, and/or the main IO write driver circuit 167 may be configured toread and write a fixed number of bits from and to the memory cell array145 independent of the selected data terminal DQ bus configuration. Readand writing a fixed number of bits may simplify operation of ECC controlcircuit 166 configured to detect and correct errors in data read fromthe memory cell array 145. For example, the ECC control circuit 166 maygenerate ECCs for a fixed number of data bits to be written to thememory cell array 145. The ECCs are written to the memory cell array 145along with the write data bits. In some examples, when fewer bits ofwrite data are received via the data terminals DQ than are needed towrite data to the memory cell array 145, then the semiconductor device100 may first perform a read operation via the read/write amplifiers 165to retrieve read data from the row and column address associated withthe write operation. The ECC control circuit 166 may check the read datafor errors to provide corrected read data. The read/write amplifiers 165or the IO circuit 170 may combine a first subset of the corrected readdata (e.g., old data) with the write data received via the dataterminals DQ for the write operation (e.g., new data) to form a set ofwrite data to be written to the memory cell array 145. The ECC controlcircuit 166 may generate an ECC code for the write data bits beingwritten to the memory cell array 145. Thus, in this scenario, the olddata may be written back to the memory.

However, to reduce current, some CS signals may be turned off if noerror is detected in a part of the read data being written back to thememory and some write operations may be masked, such as for uncorrectedold data or new data that matches old data, in some examples. Thecontrol circuit 126 may provide CS off signals CSOFF to cause the columndecoders 140 to turn off corresponding CS signals and to provide datawrite data mask and write enable signals DWDM/WREN to the read/writeamplifiers 165 based on control signals CTRL (e.g., an X4 signal, acolumn address signal CA<10>, timing signals, etc.) received from thecommand decoder 125, correct signals CORRECT received from the ECC CC166, and DM signal from the IO circuit 170. When in the x4 mode, thecontrol circuit 126 may be configured to set the DWDM signals based onthe CTRL signals (e.g., a value of a column address bit, such asCA<10>). Otherwise, the DWDM signal may be set based on the DM signal.The control circuit 126 may be configured to enable the CSOFF signal inresponse the CORRECT signals indicating no error in control planes wheredata from the previous read operation is being written back (e.g.,control planes determined based on the DWDM signal). Timing for enablingthe CSOFF signal may be determined based on timing signals from the CTRLsignals. By setting the CSOFF signal to cause the column decoders 140 toturn off corresponding CS signal lines, current consumption may bereduced. The control circuit 126 may be further configured to enable theWREN signal according to timing signals from the CTRL signals.

In response to the WREN signal and based on the DWDM signals, the mainIO write driver circuit 167 may mask write operations for the old datathat were not corrected to avoid driving the pair of main I/O signallines to write voltage polarities. In addition, the main IO write drivercircuit 167 may compare individual bits of the new data withcorresponding bits of a second subset of the read data, and mask writeoperations for the bits of the new data bits that match thecorresponding bits of the second subset of the read data to avoiddriving the pair of main IO signal lines to write voltage polarities. Bymasking write operations for at least some of the write data bits,current consumption driving the pair of main IO signal lines and duringequalization may be reduced.

Turning to the explanation of the external terminals included in thesemiconductor device 100, the clock terminals CK and /CK may receive anexternal clock signal and a complementary external clock signal,respectively. The external clock signals (including complementaryexternal clock signal) may be supplied to a clock input circuit 105. Theclock input circuit 105 may receive the external clock signals andgenerate an internal clock signal ICLK. The clock input circuit 105 mayprovide the internal clock signal ICLK to an internal clock generator107. The internal clock generator 107 may generate a phase controlledinternal clock signal LCLK based on the received internal clock signalICLK and a clock enable signal CKE from the address/command inputcircuit 115. Although not limited thereto, a DLL circuit may be used asthe internal clock generator 107. The internal clock generator 107 mayprovide the phase controlled internal clock signal LCLK to the IOcircuit 170 and a timing generator 109. The IO circuit 170 may use thephase controller internal clock signal LCLK as a timing signal fordetermining an output timing of read data. The timing generator 109 mayreceive the internal clock signal ICLK and generate various internalclock signals.

The power supply terminals may receive power supply voltages VDD andVSS.

These power supply voltages VDD and VSS may be supplied to a voltagegenerator circuit 190. The voltage generator circuit 190 may generatevarious internal voltages, VPP, VOD, VARY, VPERI, and the like based onthe power supply voltages VDD and VSS. The internal voltage VPP ismainly used in the row decoder 130, the internal voltages VOD and VARYare mainly used in the sense amplifiers 150 included in the memory cellarray 145, and the internal voltage VPERI is used in many other circuitblocks. The power supply terminals may also receive power supplyvoltages VDDQ and VSSQ. The IO circuit 170 may receive the power supplyvoltages VDDQ and VSSQ. For example, the power supply voltages VDDQ andVSSQ may be the same voltages as the power supply voltages VDD and VSS,respectively. However, the dedicated power supply voltages VDDQ and VSSQmay be used for the IO circuit 170 and the ZQ calibration circuit 175.

The calibration terminal ZQ of the semiconductor memory device 100 maybe coupled to the ZQ calibration circuit 175. The ZQ calibration circuit175 may perform a calibration operation with reference to an impedanceof the ZQ resistor (RZQ) 155. In some examples, the ZQ resistor (RZQ)155 may be mounted on a substrate that is coupled to the calibrationterminal ZQ. For example, the ZQ resistor (RZQ) 155 may be coupled to apower supply voltage (VDDQ). An impedance code ZQCODE obtained by thecalibration operation may be provided to the IO circuit 170, and thus animpedance of an output buffer (not shown) included in the IO circuit 170is specified.

FIG. 2 is a schematic block diagram of a portion of a semiconductordevice 200, in accordance with an embodiment of the present disclosure.For example, the semiconductor device 200 may include a control circuit226, ECC control circuit 266, a 268, and main IO write driver circuit267. The semiconductor device 100 of FIG. 1 may implement the portion ofthe semiconductor device 200.

The ECC control circuit 266 may include a syndrome generator 232, asyndrome decoder 234, an error corrector 236, an error locator 238, aparity generator 240, and an IO circuit 270. The syndrome generator 232may receive parity data P<L:0> and read data RD<K:0> from a memory cellarray (e.g., the memory cell array 145 of FIG. 1), and may generatesyndrome code data PC<N:0> based on the P<L:0> data and the RD<K:0>data. The P<L:0> data may be generated based on the RD<K:0> data whenthe RD<K:0> data was stored to the memory cell array 145.

The syndrome decoder 234 may receive the PC<N:0> data and may generateECC bit data ERRB<L:0> and ECC control plane data ERRCP<N:0> based onthe PC<N:0> data. In some examples, a first logical value (e.g., a lowlogical value) of a respective bit of the ERRB<L:0> data indicates arespective error and a second logical value (e.g., a high logical value)of the respective bit of the ERRB<L:0> data indicates no respectiveerror. In some examples, a first logical value (e.g., a low logicalvalue) of a respective bit of the ERRCP<N:0> data indicates a respectivecontrol plane error and a second logical value (e.g., a high logicalvalue) of the respective bit of the ERRCP<N:0> data indicates norespective control plane respective error. FIGS. 7A and 7B provideexemplary ECC bit data circuitry 700 and ECC control plane datacircuitry 710, respectively, with 8 ERRB bits (e.g., N+1 is equal to 8)and 16 control planes (e.g., L+1 is equal to 16), in accordance withembodiments of the present disclosure. In FIG. 7A, the ECC bit datacircuitry 700 includes logic circuits 701(7)-(0) each configured toreceive a combination of data from the PC<7:5> data (e.g., and/or acomplement of PC<7:5> data PCF<7:5>) to provide the respective ERRB<7:0>data. Each of the logic circuits 701(7)-(0) may include a respective ANDgate coupled in series with a respective inverter.

In FIG. 7B, the ECC control plane data circuitry 710 includes logiccircuits 711(15)-(0) each configured to receive a combination of datafrom the PC<4:0> data (e.g., and/or a complement of PC<4:0> dataPCF<4:0>) to provide the respective ERRCP<15:0> data. Each of the logiccircuits 711(15)-(0) may include a respective pair of NAND gates withoutoutputs coupled to a respective OR gate, and an output of the respectiveOR gate coupled to a respective inverter.

Turning back to FIG. 2, the error corrector 236 may receive the RD<K:0>,the ERRB<L:0> data, and the ERRCP<N:0> data, and may provide correctedread data CRD<K:0> based on the ERRB<L:0> and ERRCP<N:0> data. The errorlocator 238 may receive the ERRB<L:0> and ERRCP<N:0> data and maydetermine a location of any errors in the RD<K:0> data based on theERRB<L:0> and ERRCP<N:0> data and may provide correction location dataCORRECT<N:0> at an output. The error corrector 236 and/or the errorlocator 238 may use logic to decode the ERRB<L:0> and ERRCP<N:0> data tolocate an error within the RD<K:0> data. FIG. 7C provides exemplaryerror location circuitry 720 to compare one ERRB<X> bit with 16ERRCP<15:0> bits (e.g., L+1 is equal to 16), in accordance withembodiments of the present disclosure. In FIG. 7C, the error locationcircuitry 720 includes logic circuits 721(15)-(0) each configured toreceive a combination of data from the ERRB<X> bit (e.g., where X is anyinteger from 0 to 7) and the ERRCP<15:0> to provide the respectiveCORRECT<15:0> data. Each of the logic circuits 721(15)-(0) may include arespective NOR gate. Thus, a respective CORRECT<15:0> data bit is set toa high logical value when both of the ERRB<X> bit and the correspondingERRCP<15:0> data bit are set to a first logical value (e.g., a lowlogical value). Otherwise, the respective CORRECT<15:0> data bit is setto a second logical value (e.g., a low logical value).

Turning back to FIG. 2, the parity generator 240 may receive write dataWD<K:0> from the IO circuit 270 (e.g., the IO circuitry 170 of FIG. 1)and provide write parity data WP<L:0> at an output. The IO circuit 270may receive data DQ<M:0> via data terminals, CRD<K:0> data, and a dataterminal mode signal X4. During a write operation when the X4 signal hasa first value (e.g., logical low value), the IO circuit 270 may providethe DQ<M:0> data as the WD<K:0> (e.g., K is equal to M). During a writeoperation when the X4 signal has a second value (e.g., logical highvalue), the IO circuit 270 may provide a combination of the DQ<M:0> dataand the CRD<M:0> data as the WD<K:0> data (e.g., M+1 is equal to half ofK+1). During a read operation, the IO circuit 270 may provide some orall of the CRD<K:0> data selected based on a value of the X4 signal tothe DQ<M:0> data.

The control circuit 226 may generate data mask signals DWDM<1:0>, awrite enable signal WREN, and CS off signals CSOFF<1:0> based on the X4signal, an address bit CA<10>, a data mask signal DM (e.g., received viathe DM terminal of FIG. 1), and/or timing signals TIME. The X4 signal,the CA<10> address bit, and the TIME signals may correspond to CTRLsignals of FIG. 1. Each of the DWDM<1:0> signals correspond to differentrespective half of the control planes of a memory cell array. Thecontrol circuit 226 may set the DWDM<1:0> signals to a common logicalvalue determined based on the DM signal in response to the X4 signalindicating a first mode (e.g., when the X4 signal has a value indicatinga x8 mode). The control circuit 226 may set the DWDM<1:0> signals tocomplementary logical values determined based on the CA<10> address bitsignal in response to the X4 signal indicating a second mode (e.g., whenthe X4 signal has a value indicating a x4 mode). Thus, in the secondmode, the control circuit 226 may set one of the DWDM<1:0> may to a highlogical value to enable masking of data write operations for half of thecontrol planes that correspond to the old data, while the controlcircuit 226 may set the other to a low logical value to disable maskingof write operations for the other half of the control planes thatcorrespond to the new data.

The control circuit 226 may provide the CSOFF<1:0> signals to causecolumn decoders (e.g., the column decoders 140 of FIG. 1) to turn offcorresponding CS signals at times determined according to the TIMEsignals. Similar to the DWDM<1:0> signals, each of the CSOFF<1:0>signals correspond to different respective half of the control planes ofthe memory cell array. When in a x8 mode (e.g., determined based on theX4 signal), the control circuit 226 is configured to set the CSOFF<1:0>signals to common logical values. When in the x4 mode (e.g., determinedbased on the X4 signal), the control circuit 226 is configured to enablethe CSOFF<1:0> signals based on the CORRECT<N:0> signals and theDWDM<1:0> signals. Each of the CORRECT<N:0> corresponds to a particularcontrol plane of a memory cell array. Thus, when the DWDM<1> signal isenabled and according to timing of the TIME signals, the control circuit226 may be configured to enable the CSOFF<1> signal in response to afirst subset of CORRECT<N:0> signals corresponding to control planesassociated with the DWDM<1> signal indicate no error. Otherwise, theCSOFF<1> signal may be disabled. Similarly, when the DWDM<0> signal isenabled and according to timing of the TIME signals, the control circuit226 may be configured to enable the CSOFF<0> signal in response to asecond subset of CORRECT<N:0> signals corresponding to control planesassociated with the DWDM<0> signal indicate no error. Otherwise, theCSOFF<0> signal may be disabled. By setting one of the CSOFF<1:> signalsduring a write operation to cause the column decoders to turn offcorresponding CS signal lines, current consumption may be reduced. Thecontrol circuit 226 may be further configured to enable the WREN signalaccording to timing of the TIME signals.

FIG. 8 provides an exemplary control circuit 826 in accordance withembodiments of the present disclosure. The control circuit 826 includesa data mask circuit 810 and a CS control circuit 820. The data maskcircuit 810 may generate the DWDM<1:0> signals based on the X4 signal,the CA<10> address bit, and the DM signal. The data mask circuit 810 mayset the DWDM<1:0> signals to a common logical value determined based onthe DM signal in response to the X4 signal indicating a first mode(e.g., when the X4 signal has a value indicating a x8 mode). The datamask circuit 810 may set the DWDM<1:0> signals to complementary logicalvalues determined based on the CA<10> address bit signal in response tothe X4 signal indicating a second mode (e.g., when the X4 signal has avalue indicating a x4 mode). Thus, in the second mode, the data maskcircuit 810 may set one of the DWDM<1:0> to a high logical value toenable masking of data write operations for half of the control planesthat correspond to the old data, while the data mask circuit 810 may setthe other to a low logical value to disable masking of write operationsfor the other half of the control planes that correspond to the newdata.

At times determined according to the TIME signals, the CS controlcircuit 820 may provide the CSOFF<1:0> signals to cause column decoders(e.g., the column decoders 140 of FIG. 1) to turn off corresponding CSsignals and the WREN signal to enable write operations. In someexamples, the CS control circuit 820 may include a state machine todetermine when and how to set the CSOFF<1:0> signals and the WRENsignal. When in a x8 mode (e.g., determined based on the X4 signal), theCS control circuit 820 is configured to set the CSOFF<1:0> signals tocommon logical values. When in the x4 mode (e.g., determined based onthe X4 signal), the CS control circuit 820 is configured to enable theCSOFF<1:0> signals based on the CORRECT<N:0> signals and the DWDM<1:0>signals from the data mask circuit 810. Thus, when the DWDM<1> signal isenabled and according to timing of the TIME signals, the CS controlcircuit 820 may be configured to enable the CSOFF<1> signal in responseto a first subset of CORRECT<N:0> signals corresponding to controlplanes associated with the DWDM<1> signal indicate no error. Otherwise,the CSOFF<1> signal may be disabled. Similarly, when the DWDM<0> signalis enabled and according to timing of the TIME signals, the CS controlcircuit 820 may be configured to enable the CSOFF<0> signal in responseto a second subset of CORRECT<N:0> signals corresponding to controlplanes associated with the DWDM<0> signal indicate no error. Otherwise,the CSOFF<0> signal may be disabled. The control circuit 226 may befurther configured to enable the WREN signal according to timing of theTIME signals.

Turning back to FIG. 2, the main IO write driver circuit 267 may receivethe CORRECT<N:0> data, the CRD<K:0> data, the WP<L:0> data, the WD<K:0>data, the DWDM<1:0> signals, the X4 signal, a write enable signal WREN(e.g., via control signals from a command decoder, such as the CTRLsignals from the command decoder 125 of FIG. 1). During a writeoperation, the main IO write driver circuit 267 may be configured todrive main IO lines for various control planes of a memory cell arraybased on values of the CORRECT<N:0> data, the CRD<K:0> data, the WP<L:0>data, the WD<K:0> data, the DWDM<1:0> signals, the X4 signal, the WRENsignal, or combinations thereof.

In operation, the ECC control circuit 266 and the IO circuit 270 maysupport a read operation from a memory cell array and the ECC controlcircuit 266, the IO circuit 270, the control circuit 226, and the mainIO write driver circuit 267 may support a write operation to the memorycell array. In some examples, the semiconductor device 200 may beconfigured to operate the IO circuit IO circuit 270 in a selected one ofmultiple data terminal DQ bus configurations (e.g., data bus widthmodes), such as a x4 mode (e.g., data bus is 4 bits wide), a x8 mode(e.g., data bus is 8 bits wide), etc. The X4 signal be determine theselected DQ bus configuration, in some examples. For example, when theX4 signal is set to a low logical value, the semiconductor device 200may operate in a first mode (e.g., a x8 data mode). When the X4 signalis set to a high logical value, the semiconductor device 200 may operatein a second mode (e.g., a x4 data mode). During a read or writeoperation, data bits are sent or received via the data terminals DQ overa fixed burst length (e.g., 8, 16, 32, etc. bit burst lengths), in someexamples. Thus, the number of write bits received when in the x4 modemay be different than the number of write bits received when operatingin the x8 mode. For example, if the burst length is 16 bits, then 64bits would be received in the x4 mode and 128 bits would be received inthe x8 mode.

Thus, when a read command and a row address and a column address arereceived at the semiconductor device 200, the RD<K:0> data and theP<L:0> data may be read from the memory cell array designated by the rowaddress and the column address. The syndrome generator 232 may beconfigured to generate the PC<N:0> data based on the P<L:0> data and theRD<K:0> data. The syndrome decoder 234 may decode the PC<N:0> data toprovide both the ERRB<L:0> data and ERRCP<N:0> data. The error corrector236 may decode the ERRB<L:0> data and ERRCP<N:0> data to correct errorswithin the RD<K:0> to provide the CRD<K:0> data. Based on the mode ofoperation determined by the X4 signal, the IO circuit 270 may providesome or all of the CRD<K:0> data as the DQ<M:0> data. For example, whenin the first mode (e.g., the x8 mode), the IO circuit 270 may provideall of the CRD<K:0> bits as the DQ<M:0> data (e.g., M is equal to K).When in the second mode (e.g., the x4 mode), the IO circuit 270 mayprovide a selected M+1 bits of the CRD<K:0> data (e.g., CRD<K:M+1> data,CRD<M:0> data, or some other combination of M+1 bits of the CRD<K:0>data) as the DQ<M:0> data. The selected subset of the M+1 bits of theCRD<K:0> data may be based on the received column and row address.

When a write command and a row address and a column address are receivedat the semiconductor device 200, write data may be received at the IOcircuit 270 via the DQ<M:0> data. When in the first mode (e.g., the x8mode), the IO circuit 270 may provide all of the DQ<M:0> data as theWD<K:0> data (e.g., M is equal to K) to the parity generator 240. Theparity generator 240 may encode the WP<L:0> data based on the WD<K:0>data. The control circuit 226 may drive the DWDM<1:0> signals based onthe DM signal when in the first mode. In addition the control circuit226 may enable the WREN signal according to timing of the TIME signalsduring the write operation to enable writing to the memory cell array.The main IO write driver circuit 267 may drive main IO lines to writethe WD<K:0> and the WP<L:0> data to the memory cell array in response tothe WREN signal, with some write operations masked by the DWDM<1:0>signals.

When operating in the second mode (e.g., x4 mode), a count of the M+1bits received in the DQ<M:0> data may be less than a count of K+1 bitsof the WD<K:0> data used by the parity generator 240 to generate theWP<L:0> bits. In an example, M+1 may be half of K+1. In a specificexample, M may be equal to 64 and K may be equal to 128. Thus, thesemiconductor device 200 may first perform a read operation to retrieveadditional data to combine with the DQ<M:0> data to provide the WD<K:0>data. The read operation may include retrieving the RD<K:0> data and theP<L:0> data from the memory cell array at a location determined by therow and column addresses of received with the write command. The readoperation may include the syndrome generator 232, the syndrome decoder234, and the error corrector 236 processing the RD<K:0> data and theP<L:0> data to provide the ERRB<L:0> data, the ERRCP<N:0> data, and theCRD<K:0> data. In addition, the error locator 238 may provide theCORRECT<N:0> data.

For example, FIG. 5 provides an exemplary flow diagram of the secondmode initial read operation, in accordance with embodiments of thepresent disclosure. As shown in FIG. 5, the syndrome generator 532 mayreceive the RP<L:0> data and the RD<K:0> data from the memory cellarray, and may generate the PC<L:0> data in response. The syndromedecoder 534 may generate the ERRB<L:0> data and the ERRCP<N:0> databased on the PC<L:0> data. The error locator 538 may determine locationsof errors and provide the CORRECT<N:0> data to the main IO drivercircuit 567 by decoding the ERRB<L:0> data and the ERRCP<N:0> data. Theerror correction 536 may correct the RD<K:0> data based on the ERRB<L:0>data and the ERRCP<N:0> data.

Turning back to FIG. 2, the IO circuit 270 may combine the CRD<M:0> datasubset (e.g., old data) with the DQ<M:0> data (e.g., new data) toprovide the WD<K:0> data. The parity generator 240 may encode theWP<L:0> data based on the WD<K:0> data. The control circuit 226 mayprovide complementary values on the DWDM<1:0> signals based on a valueof the CA<10> bit while in the second mode. For example, when the CA<10>bit has a first logical value, the control circuit 226 may provide theDWDM<1> signal with a first logical value and the DWDM<0> with a secondlogical value. When the CA<10> bit has a second logical value, thecontrol circuit 226 may provide the DWDM<1> signal with the secondlogical value and the DWDM<0> with the first logical value. In addition,according to timing of the TIME signals, the control circuit 226 may beconfigured to enable one of the CSOFF<1:0> signals when no error isdetected according to a respective subset of the CORRECT<N:0> signalsthat corresponding to control planes associated with an enabled one ofthe DWDM<1:0> signals (e.g., corresponding to old data being writtenback to the memory cell array). Thus, when the DWDM<1> signal is enabledand according to timing of the TIME signals, the control circuit 226 maybe configured to enable the CSOFF<1> signal in response to a firstsubset of CORRECT<N:0> signals corresponding to control planesassociated with the DWDM<1> signal indicate no error. Otherwise, theCSOFF<1> signal may be disabled. Similarly, when the DWDM<0> signal isenabled and according to timing of the TIME signals, the control circuit226 may be configured to enable the CSOFF<0> signal in response to asecond subset of CORRECT<N:0> signals corresponding to control planesassociated with the DWDM<0> signal indicate no error. Otherwise, theCSOFF<0> signal may be disabled. The control circuit 226 may be furtherconfigured to enable the WREN signal according to timing of the TIMEsignals. Timing of the WREN signal being enabled and one of theCSOFF<1:0> signals being enabled may be coincident or contemporaneous.By enabling one of the CSOFF<1:0> signals prior to initiating the writeoperation (e.g., enabling the WREN signal), current consumption may bereduced.

The main IO write driver circuit 267 may receive the CORRECT<N:0> data,the CRD<K:0> data, the WD<K:0> data, the WP<L:0> data, the DWDM<1:0>signals, the WREN signal, and the X4 signal. The main IO write drivercircuit 267 may drive main IO lines to write the WD<K:0> to the memorycell array based on the received signals/data. FIG. 6 is an exemplaryflow diagram of the second mode write operation for driving signals tothe main IO write driver circuit 267, in accordance with embodiments ofthe present disclosure. As shown in FIG. 6, the error corrector 636 mayprovide the CORRECT<L:0> data (e.g., to indicate which bits have changedin the data being rewritten to the memory cell array 668) and theCRD<K:0> data to the main IO write driver circuit 667, a first subset ofthe CRD<K:0> data to the comparator 670, and a remaining subset of theCRD<K:0> data to the parity generator 640. The comparator 670 maybitwise compare the remaining subset of the CRD<K:0> data with theDQ<M:0> data to provide a same data signals SD<M:0> that indicate whichbits are different to the main IO write driver circuit 667. The paritygenerator 640 may encode the WP<L:0> data based on a combination of theDQ<M:0> data and the first subset of the CRD<K:0> data (e.g., theWD<K:0> data). The main IO write driver circuit 667 may drive main IOlines to write the WD<K:0> and the WP<L:0> to the memory cell array 668.The main IO write driver circuit 667 may use the SD<M:0> signals to onlyperform write operations to the memory cell array 668 for bits that aredifferent between the DQ<M:0> data and the first subset of the CRD<K:0>data and may use the CORRECT<L:0> data to only perform write operationsto the memory cell array 668 for bits that are corrected within theCRD<K:0>.

Turning back to FIG. 2, based on the DWDM<1:0> signals, the CORRECT<L:0>data, and bitwise differences between overlapping bits of the CRD<K:0>data and the DQ<M:0> data within the WD<K:0> data, the main IO writedriver circuit 267 may mask write operations for certain bits of theWD<K:0> data that match previously-stored data. The previously-storeddata may be available because of the read operation performed before thewrite operation while in the second mode. Thus, write operations for thesubset of bits of the WD<K:0> that include a direct copy of a subset ofthe CRD<K:0> data (e.g., old data) that were not corrected (e.g., basedon the CORRECT<N:0> data) may be masked to avoid driving the pair ofmain I/O signal lines to write voltage polarities. In addition, datawrite operations for the subset of bits of the WD<K:0> that include theDQ<M:0> data (e.g., new data) may be masked for the bits of the new datathat match corresponding bits of the CRD<K:0> data (e.g., old data) toavoid driving the pair of main I/O signal lines to write voltagepolarities. By masking write operations for at least some of the writedata bits, current consumption driving the pair of main IO signal linesand during equalization may be reduced.

FIG. 3 is a schematic block diagram of a main IO write driver circuit367, in accordance with an embodiment of the present disclosure. Themain IO write driver circuit 167 of FIG. 1 and/or the main IO writedriver circuit 267 of FIG. 2 may implement the portion of the main IOwrite driver circuit 367. The main IO write driver circuit 367 mayinclude individual write drivers 310(0)-(7) each configured to driverespective pairs of control plane main IO lines MIO CP0-15, and a 311configured to drive a pair of ECC IO signal lines.

The main IO write driver circuit 367 may receive the CORRECT<15:0> data,the CRD<127:0> data, the WP<7:0> data, the WD<127:0> data, the DWDM<1:0>signals (e.g., from the control circuit 126 of FIG. 1 and/or the controlcircuit 226 of FIG. 2), a write enable signal WREN (e.g., from thecontrol circuit 126 of FIG. 1 and/or the control circuit 226 of FIG. 2),and an X4 signal (e.g., from the CTRL signals of FIG. 1). During a writeoperation, each of the write drivers 310(0)-(7) may be configured todrive the respective pairs of the MIO CP0-15 signal lines to write datato control planes of a memory cell array based on values of theCORRECT<15:0> data, the CRD<127:0> data, the WP<7:0> data, the WD<127:0>data, the DWDM<1:0> signals, the WREN signal, or combinations thereof.The 311 may be configured to drive the ECC IO signal lines to write theWP<L:0> data to the memory cell array.

In operation, when in a first mode (e.g., the X4 signal has a lowlogical value indicating the x8 mode), each of the write drivers310(0)-(7) may drive the respective pairs of the MIO CP0-15 signal linesto write the WD<127:0> data to the memory cell array, with maskingperformed based on the DWDM<1:0> signal, and the 311 may be configuredto drive the ECC IO signal lines to write the WP<L:0> data to the memorycell array.

When in a second mode (e.g., the X4 signal has a high logical valueindicating the x4 mode), each of the write drivers 310(0)-(7) may drivethe respective pairs of the MIO CP0-15 signal lines to write theWD<127:0> and the WP<7:0> data to the memory cell array, and the 311 maybe configured to drive the ECC IO signal lines to write the WP<L:0> datato the memory cell array. However, based on the DWDM<1:0> signals, theCORRECT<15:0> data, and bitwise differences between the CRD<127:0> dataand the WD<127:0> data, the each of the write drivers 310(0)-(7) maymask write operations for certain bits of the WD<127:0> data that matchpreviously-stored data bits. The previously-stored data information isavailable due to the read operation performed before the write operationwhile in the second mode. Thus, data write operations for the subset ofbits of the WD<127:0> that include a direct copy of a subset of theCRD<127:0> data may be masked for bits that were not changed (e.g.,based on the CORRECT<15:0> data) to avoid driving the pair of main I/Osignal lines to write voltage polarities. In addition, data writeoperations for the subset of bits of the WD<127:0> that include new data(e.g., the DQ<M:0> data of FIG. 2, where M is equal to 64) may be maskedfor the bits that match corresponding bits of the CRD<127:0> data (e.g.,old data) to avoid the driving the pair of main I/O signal lines towrite voltage polarities. By masking write operations for at least someof the write data bits, current consumption driving the pair of main IOsignal lines and during equalization may be reduced. While FIG. 3depicts 8 of the write drivers 310(0)-(7), more or fewer than 8 MIOwrite drivers may be included without departing from the scope of thedisclosure. Further, while FIG. 3 includes 128 bits of read and writedata, 16 control planes, 8 bits of write parity data, etc., othercombinations read and write data, control plane counts, and parity bitdata may be implemented without departing from the scope of thedisclosure.

FIG. 4 is a schematic block diagram of a portion of a write driver 400configured to control voltages on complementary main IO signal linesMIOT and MIOB, in accordance with an embodiment of the presentdisclosure. The main IO write driver circuit 167 of FIG. 1, the main IOwrite driver circuit 267 of FIG. 2, and/or the any of the write drivers310(0)-(7) of FIG. 3 may implement the portion of the write driver 400.The write driver 400 may include a data write data mask generator 410, afirst driver circuit 420, and a second driver circuit 430.

The data write data mask generator 410 may be configured to provide aninternal data write data mask signal DWDM2 based on the DWDM<X> (e.g.,the DWDM signal of FIG. 1, and/or one of the DWDM<1:0> signals fromeither or both of FIGS. 2 and 3), a comparison between the CRD<Y> bit(e.g., of the CRD<K:0> data of FIG. 2 or FIG. 3) and the WD<Z> bit(e.g., of the WD<K:0> data of FIG. 2 and/or FIG. 3), and an X4 signalconfigured to indicate a x4 or a x8 mode. In some examples, Y and Z arethe same corresponding bits. The data write data mask generator 410 mayinclude an inverter 411, an exclusive NOR gate 412, a NAND gate 413, aNAND gate 414, and a NAND gate 415. The inverter 411 may provide acomplementary a logical value of the DWDM<X> signal to a first input ofthe NAND gate 414 and a first input of the NAND gate 414. The exclusiveNOR gate 412 may perform an exclusive NOR logical comparison between theCRD<Y> bit (e.g., old data) and the WD<Z> bit (e.g., new data) andprovide a result of the exclusive NOR comparison to a first input of theNAND gate 413. Thus, the output of the exclusive NOR gate 412 mayindicate whether the old data matches the new data. The NAND gate 413may perform a NAND logical comparison between the X4 signal and theoutput of the exclusive NOR gate 412 and provide an output based on thecomparison to a second input of the NAND gate 414. The NAND gate 414 mayperform a NAND logical comparison between the output of the inverter 411and the output of the NAND gate 413 and provide an output based on thecomparison to a second input of the NAND gate 415. The NAND gate 415perform a NAND logical comparison between the output of the inverter 411and the output of the NAND gate 414 to provide the DWDM2 based on thecomparison.

The first driver circuit 420 and the second driver circuit 430 areconfigured to control the pull-down circuit 404 and the pull-up circuit405 to drive the MIOT and MIOB signal lines to complementary logicalvalues (e.g., based on the VSS and VPERI voltages). The MIOT and MIOBsignal lines may be implemented in the MIOT/B signal lines of FIG. 1and/or any of the MIO CP0-15 signal lines of FIG. 3.

The first driver circuit 420 may include an inverter 421, an OR gate422, a NAND gate 423, an OR gate 424, a NAND gate 425, and an inverter426. The OR gate 422 may be configured to perform a logical ORcomparison between a logical complement of the CRD<Y> bit via theinverter 421 and a logical complement of the CORRECT<W> signalCORRECTF<W> (e.g., complement of any of the CORRECT<N:0> signals of FIG.2 and/or FIG. 3) and provide an output based on the comparison to afirst input of the NAND gate 423. The CORRECTF<W> signal having a highlogical value indicates no bit error (e.g., no correction of bitnecessary) and having a low logical indicates a single-bit error (e.g.,bit should be corrected). The NAND gate 423 may perform a NAND logicalcomparison between the output of the OR gate 422 and the DWDM2 signaland provide an output based on the comparison to a first input of theNAND gate 425. The OR gate 424 may perform an OR logical comparisonbetween the DWDM2 signal and the WD<Z> bit and provide an output basedon the comparison to a second input of the NAND gate 425. The NAND gate425 may perform a NAND logical comparison between the output of the NANDgate 423, the output of the OR gate 424, and a write enable signal WRENreceived at a third input and provide an output based on the comparisonto a first n-type transistor of the pull-down circuit 404 via theinverter 426 and to a second p-type transistor of the pull-up circuit405.

The second driver circuit 430 may include an inverter 431, an OR gate432, a NAND gate 433, an OR gate 434, a NAND gate 435, and an inverter436. The OR gate 432 may be configured to perform a logical ORcomparison between the CRD<Y> bit and CORRECTF<W> signal and provide anoutput based on the comparison to a first input of the NAND gate 433.The NAND gate 433 may perform a NAND logical comparison between theoutput of the OR gate 432 and the DWDM2 signal and provide an outputbased on the comparison to a first input of the NAND gate 435. The ORgate 434 may perform an OR logical comparison between the DWDM2 signaland a logical complement of the WD<Z> bit via the inverter 431 andprovide an output based on the comparison to a second input of the NANDgate 435. The NAND gate 435 may perform a NAND logical comparisonbetween the output of the NAND gate 433, the output of the OR gate 434,and the WREN signal received at a third input and provide an outputbased on the comparison to a second n-type transistor of the pull-downcircuit 404 via the inverter 436 and to a first p-type transistor of thepull-up circuit 405.

During a write operation (e.g., when the WREN enable signal is set to ahigh logical value), when in a first mode (e.g., the X4 signal has a lowlogical value indicating the x8 mode), one of the first driver circuit420 or the second driver circuit 430 may enable a respective transistorof each of the pull-down circuit 404 and the pull-up circuit 405 todrive the pair of MIOT and MIOB signal lines to complementary logicalvoltages based on the DWDM<X> signal and the WREN signal. Within thedata write data mask generator 410, the output of the NAND gate 413 isheld high based on the X4 signal having a low logical value, which maycause the NAND gate 415 to provide the DWDM2 signal based on a value ofthe DWDM<X> signal (e.g., ignoring a value of the comparison between theCRD<Y> and WD<Z> bits).

When in a second mode (e.g., the X4 signal has a high logical valueindicating the x4 mode), the first driver circuit 420 and the seconddriver circuit 430 may drive the respective pairs of the MIO CP0-15signal lines to write the WD<K:0> and the WP<L:0> data to the memorycell array based on the DWDM<X> signal, a comparison between the CRD<Y>and WD<Z> bits, the CORRECTF<W> signal, and the WREN signal.

For example, within the data write data mask generator 410, when theDWDM<X> signal has a high logical value, the NAND gate 415 may providethe DWDM2 signal having a high logical value (e.g., when the WD<X> bitis old data from the read operation). When the DWDM<X> signal has a lowlogical value (e.g., when the WD<X> bit is new data), the NAND gate 415may provide the DWDM2 signal having a low logical value when a valuebased on the comparison between the WD<X> bit and the CRD<Y> bit. Thus,when the WD<X> bit and the CRD<Y> bit match, the NAND gate 415 mayprovide the DWDM2 signal having a high logical value. When the WD<X> bitand the CRD<Y> bit have different logical values, the NAND gate 415 mayprovide the DWDM2 signal having a low logical value.

When the DWDM2 signal has a low logical value, the first driver circuit420 may drive the MIOT signal line to a high logical value (e.g., theVPERI voltage) (e.g., by enabling the second p-type transistor of thepull-up circuit 405) and the MIOB signal line to a low logical value(e.g., the VSS voltage) (e.g., by enabling the first n-type transistorof the pull-up circuit 405) when the WD<Z> bit has a high logical value.When the DWDM2 signal has a high logical value, the first driver circuit420 may drive the MIOT signal line to the high logical value (e.g., theVPERI voltage) and the MIOB signal line to the low logical value (e.g.,the VSS voltage) when the RD<Y> bit has a high logical value and theCORRECTF<W> signal has a low logical value. Otherwise, the first drivercircuit 420 may disable the first n-type transistor of the pull-downcircuit 404 and the second p-type transistor of the pull-up circuit 405to control voltages of the MIOB and MIOT signal lines, respectively.

When the DWDM2 signal has a low logical value, the second driver circuit430 may drive the MIOB signal line to a high logical value (e.g., theVPERI voltage) (e.g., by enabling the first p-type transistor of thepull-up circuit 405) and the MIOT signal line to a low logical value(e.g., the VSS voltage) (e.g., by enabling the second n-type transistorof the pull-down circuit 404) when the WD<Z> bit has a low logicalvalue. When the DWDM2 signal has a high logical value, the second drivercircuit 430 may drive the MIOB signal line to the high logical value(e.g., the VPERI voltage) and the MIOT signal line to the low logicalvalue (e.g., the VSS voltage) when the RD<Y> bit and the CORRECTF<W>signal both have a low logical values. Otherwise, the first drivercircuit 420 may disable the first n-type transistor of the pull-downcircuit 404 and the second p-type transistor of the pull-up circuit 405.

Thus, in summary, during the first mode of operation, data writeoperations are controlled by an external mask signal. Bitwise masking inthe first mode may be limited because no read operation is performedbefore starting the data write operations. However, during the secondmode of operation, a data read operation is first performed makingpreviously stored data available. Thus, data write operations in thesecond mode may be masked for old read data that is not corrected (e.g.,via the CORRECTF<W> signal having a high logical value) and for new datathat matches old data that is not corrected. By masking write operationsfor at least some of the write data bits in the second mode, currentconsumption driving the MIOT and MIOB signal lines and duringequalization may be reduced.

Although the detailed description describes certain preferredembodiments and examples, it will be understood by those skilled in theart that the scope of the disclosure extends beyond the specificallydisclosed embodiments to other alternative embodiments and/or uses ofthe embodiments and obvious modifications and equivalents thereof. Inaddition, other modifications which are within the scope of thedisclosure will be readily apparent to those of skill in the art. It isalso contemplated that various combination or sub-combination of thespecific features and aspects of the embodiments may be made and stillfall within the scope of the disclosure. It should be understood thatvarious features and aspects of the disclosed embodiments can becombined with or substituted for one another in order to form varyingmode of the disclosed embodiments. Thus, it is intended that the scopeof at least some of the present disclosure should not be limited by theparticular disclosed embodiments described above.

What is claimed is:
 1. An apparatus comprising: a read/write amplifiercircuit configured to combine write data associated with a write commandand read data received from a memory array to form combined data,wherein the read/write amplifier circuit is configured to determine anerror correction code for the combined data, wherein the read/writeamplifier circuit is configured to initiate a write operation to write afirst bit of the combined data corresponding to the write data to thememory array, to mask writing of a second bit of the combined datacorresponding to the read data, and to write the error correcting codeto the memory array.
 2. The apparatus of claim 1, wherein the read/writeamplifier is configured to perform an error correction operation basedon raw read data and a read data error correction code from the memoryarray to provide the corrected read data, wherein the read data is asubset of the corrected read data.
 3. The apparatus of claim 2, whereinthe corrected read data includes more bits than the write data.
 4. Theapparatus of claim 2, wherein the read/write amplifier is configured tomask a write operation of a particular bit of the combined data thatcorresponds to the write data in response to the particular bit matchinga value of a corresponding bit of the raw read data.
 5. The apparatus ofclaim 2, wherein the read/write amplifier comprises an error-correctingcode (ECC) control circuit configured to generate the corrected readdata based on the raw read data and the read data error correction code.6. The apparatus of claim 5, wherein, when an error is detected in theraw read data, the ECC control circuit is configured to determine alocation of the error in the raw read data using the read data errorcorrection code to correct the error.
 7. The apparatus of claim 5,wherein the ECC control circuit is further configured to determine theerror correction code for the combined data.
 8. The apparatus of claim1, wherein the read/write amplifier is configured to cause a columndecoder to disable a column select signal to mask writing of a secondbit of the combined data corresponding to the read data.
 9. Theapparatus of claim 1, wherein the a read/write amplifier circuit isconfigured to combine the write data associated with the write commandand the read data received from the memory array to form the combineddata while in a first mode of operation, wherein the read-writeamplifier circuit is further configured to write second write dataassociated with a second write command to the memory array during whilein a second mode of operation.
 10. The apparatus of claim 9, wherein thewrite data received while in the first mode of operation includes fewerbits than the second write received while in the second mode.
 11. Theapparatus of claim 1, wherein the read/write amplifier circuit isconfigured to disable first pull-up and pull-down circuitry coupled to afirst pair of main I/O lines to mask writing of the second bit of thecombined data corresponding to the read data to the memory array, and toenable second pull-up and pull-down circuitry coupled to a second pairof main I/O lines to write the first bit of the combined datacorresponding to the write data to the memory array.
 12. A methodcomprising: combining, at a semiconductor device, write datacorresponding to a write command with read data retrieved from a memorycell array of the semiconductor device to provide combined data; duringa write operation directed to the combined data: masking a first bit ofthe combined data that corresponds to the read data from being writtento the memory cell array; and writing a second bit of the combined datathat corresponds to the write data to the memory cell array.
 13. Themethod of claim 12, further comprising performing an error correctionoperation based on raw read data and a read data error correction codefrom the memory array to provide the corrected read data, wherein theread data is a subset of the corrected read data.
 14. The method ofclaim 13, wherein the corrected read data includes more bits than thewrite data.
 15. The method of claim 13, further comprising masking awrite operation of a particular bit of the combined data thatcorresponds to the write data in response to the particular bit matchinga value of a corresponding bit of the raw read data.
 16. The method ofclaim 13, further comprising, in response to detection of an error inthe raw read data, determining a location of the error in the raw readdata using the read data error correction code to correct the error. 17.The method of claim 12, further comprising writing an error correctioncode for the combined data to the memory cell array.
 18. The method ofclaim 16, further comprising determining the error correction code forthe combined data.
 19. The method of claim 13, further comprising:combining the write data associated with the write command and the readdata received from the memory array to form the combined data while in afirst mode of operation; and writing second write data associated with asecond write command to the memory array during while in a second modeof operation.
 20. The method of claim 19, wherein the write datareceived while in the first mode of operation includes fewer bits thanthe second write received while in the second mode.